A logic diagnosis methodology for improved localization and extraction of accurate defect behavior

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Desineni, R ^a   Poku, O ^a   Blanton, R D ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SYSTEM RECOVERY; FEATURE EXTRACTION; INFORMATION ANALYSIS; INTEGRATED CIRCUITS; LOGIC DESIGN; MATHEMATICAL MODELS;

DEFECT BEHAVIOR; LOGIC DIAGNOSIS; LOGIC-LEVEL DEFECTS;

FAULT TOLERANCE;

EID: 39749170502     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297627     Document Type: Conference Paper

References (16)