Improving precision using mixed-level fault diagnosis

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Amyeen, M Enamul ^a   Nayak, Debashis ^a   Venkataraman, Srikanth ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC CIRCUITS; NANOELECTRONICS; PROBLEM SOLVING; SEMICONDUCTING SILICON; SWITCHING THEORY;

MANUFACTURING FABRICATION; MIXED-LEVEL DIAGNOSIS; MIXED-LEVEL FAULT DIAGNOSIS; SWITCH-LEVEL ANALYSIS;

FAULT TOLERANCE;

EID: 39749143881     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297661     Document Type: Conference Paper

References (20)