메뉴 건너뛰기




Volumn 102, Issue 3, 2007, Pages

Revisit to the finite element modeling of electromigration for narrow interconnects

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONTACTS; ELECTROMIGRATION; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; RELIABILITY THEORY;

EID: 34548104313     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2761434     Document Type: Article
Times cited : (56)

References (24)
  • 3
    • 33644906605 scopus 로고    scopus 로고
    • 0040-6090 10.1016/j.tsf.2005.09.101
    • C. M. Tan and A. Roy, Thin Solid Films 0040-6090 10.1016/j.tsf.2005.09. 101 504, 288 (2006).
    • (2006) Thin Solid Films , vol.504 , pp. 288
    • Tan, C.M.1    Roy, A.2
  • 4
    • 34249887657 scopus 로고    scopus 로고
    • 0021-8979 10.1063/1.2723869
    • W. Li, C. M. Tan, and Y. J. Hou, J. Appl. Phys. 0021-8979 10.1063/1.2723869 101, 104314 (2007).
    • (2007) J. Appl. Phys. , vol.101 , pp. 104314
    • Li, W.1    Tan, C.M.2    Hou, Y.J.3
  • 5
    • 0016348990 scopus 로고
    • Proceeding of the 12th IEEE International Symposium on Reliability Physics, Las Vegas, Nevada (IEEE, New York
    • J. R. Black, Proceeding of the 12th IEEE International Symposium on Reliability Physics, Las Vegas, Nevada (IEEE, New York, 1974), April 2-4, pp. 142-149.
    • (1974) , pp. 142-149
    • Black, J.R.1
  • 6
    • 0004255385 scopus 로고
    • McGraw-Hill Series in Mat. Sci. And Eng., (McGraw-Hill Book Comp, New York
    • P. G. Shewmon, Diffusion in Solids, McGraw-Hill Series in Mat. Sci. And Eng., (McGraw-Hill Book Comp, New York, 1963), p. 189.
    • (1963) Diffusion in Solids , pp. 189
    • Shewmon, P.G.1
  • 8
    • 0022013797 scopus 로고
    • 0021-8979 10.1063/1.334726
    • C. J. Shirley, J. Appl. Phys. 0021-8979 10.1063/1.334726 57, 777 (1985).
    • (1985) J. Appl. Phys. , vol.57 , pp. 777
    • Shirley, C.J.1
  • 15
    • 0000898275 scopus 로고    scopus 로고
    • 0021-8979 10.1063/1.372452
    • Q. F. Duan and Y. -L. Shen, J. Appl. Phys. 0021-8979 10.1063/1.372452 87, 4039 (2000).
    • (2000) J. Appl. Phys. , vol.87 , pp. 4039
    • Duan, Q.F.1    Shen, Y.-L.2
  • 17
    • 84961730147 scopus 로고    scopus 로고
    • Proceedings of the IEEE 2002 International Interconnect Technology Conference
    • A. H. Fischer, V. Glasow, S. Penka, and F. Ungar, Proceedings of the IEEE 2002 International Interconnect Technology Conference, 2002, pp. 139-141.
    • (2002) , pp. 139-141
    • Fischer, A.H.1    Glasow, V.2    Penka, S.3    Ungar, F.4
  • 20
    • 0344946287 scopus 로고    scopus 로고
    • 0021-8979 10.1063/1.1621727
    • D. Padhi and G. Dixit, J. Appl. Phys. 0021-8979 10.1063/1.1621727 94, 6463 (2003).
    • (2003) J. Appl. Phys. , vol.94 , pp. 6463
    • Padhi, D.1    Dixit, G.2
  • 21
    • 0343777268 scopus 로고    scopus 로고
    • 1359-6454 10.1016/S1359-6454(00)00008-2
    • Y. -L. Shen, Y. L. Guo, and C. A. Minor, Acta Mater. 1359-6454 10.1016/S1359-6454(00)00008-2 48, 1667 (2000).
    • (2000) Acta Mater. , vol.48 , pp. 1667
    • Shen, Y.-L.1    Guo, Y.L.2    Minor, C.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.