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Volumn 306, Issue 2, 2007, Pages 262-268
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Crystal-originated particles in germanium-doped Czochralski silicon crystal
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Author keywords
A1. Doping; A1. Germanium; A1. Point defects; A2. Czochralski method; A2. Single crystal growth; B2. Semiconducting silicon
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Indexed keywords
ANNEALING;
GERMANIUM;
POINT DEFECTS;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DOPING;
SINGLE CRYSTALS;
THERMODYNAMIC STABILITY;
FREE VACANCY CONCENTRATION;
OXYGEN INTERSTITIALS;
SINGLE-CRYSTAL GROWTH;
STRESS COMPENSATION;
CRYSTAL GROWTH FROM MELT;
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EID: 34547686506
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2007.05.034 Document Type: Article |
Times cited : (15)
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References (22)
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