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Volumn 306, Issue 2, 2007, Pages 262-268

Crystal-originated particles in germanium-doped Czochralski silicon crystal

Author keywords

A1. Doping; A1. Germanium; A1. Point defects; A2. Czochralski method; A2. Single crystal growth; B2. Semiconducting silicon

Indexed keywords

ANNEALING; GERMANIUM; POINT DEFECTS; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; SINGLE CRYSTALS; THERMODYNAMIC STABILITY;

EID: 34547686506     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2007.05.034     Document Type: Article
Times cited : (15)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.