-
1
-
-
0041633858
-
Parameter Variations and Impact on Circuits and Microarchitecture
-
June
-
S. Borkar, T. Karnik, S. Narendra, J. Tschanz, A. Keshavarzi, and V. De, "Parameter Variations and Impact on Circuits and Microarchitecture," in Proc. DAC, pp. 338-342, June 2003.
-
(2003)
Proc. DAC
, pp. 338-342
-
-
Borkar, S.1
Karnik, T.2
Narendra, S.3
Tschanz, J.4
Keshavarzi, A.5
De, V.6
-
2
-
-
1542269365
-
Statistical Estimation of Leakage Current Considering Inter- and Intra-die Process Variation
-
Aug
-
R. Rao, A. Srivastava, D. Blaauw, and D. Sylvester, "Statistical Estimation of Leakage Current Considering Inter- and Intra-die Process Variation," in Proc. ISLPED, pp. 84-89, Aug. 2003.
-
(2003)
Proc. ISLPED
, pp. 84-89
-
-
Rao, R.1
Srivastava, A.2
Blaauw, D.3
Sylvester, D.4
-
3
-
-
1542329235
-
Modeling and Estimation of Total Leakage Current in Nano-scaled CMOS Devices Considering the Effect of Parameter Variation
-
Aug
-
S. Mukhopadhyay and K. Roy, "Modeling and Estimation of Total Leakage Current in Nano-scaled CMOS Devices Considering the Effect of Parameter Variation," in Proc. ISLPED, pp. 172-175, Aug. 2003.
-
(2003)
Proc. ISLPED
, pp. 172-175
-
-
Mukhopadhyay, S.1
Roy, K.2
-
4
-
-
4444351567
-
Parametric Yield Estimation Considering Leakage Variability
-
June
-
R. R. Rao, A. Devgan, D. Blaauw, and D. Sylvester, "Parametric Yield Estimation Considering Leakage Variability," in Proc. DAC, pp. 442-447, June 2004.
-
(2004)
Proc. DAC
, pp. 442-447
-
-
Rao, R.R.1
Devgan, A.2
Blaauw, D.3
Sylvester, D.4
-
5
-
-
27944470947
-
Full Chip Analysis of Leakage Power Under Process Variations, Including Spatial Correlations
-
June
-
H. Chang and S. Sapatnekar, "Full Chip Analysis of Leakage Power Under Process Variations, Including Spatial Correlations," in Proc. DAC, pp. 523-528, June 2005.
-
(2005)
Proc. DAC
, pp. 523-528
-
-
Chang, H.1
Sapatnekar, S.2
-
6
-
-
0036858210
-
Adaptive Body Bias for Reducing Impacts of Die-to-Die and Within-Die Parameter Variations on Microprocessor Frequency and Leakage
-
Nov
-
J. W. Tschanz et. al., "Adaptive Body Bias for Reducing Impacts of Die-to-Die and Within-Die Parameter Variations on Microprocessor Frequency and Leakage," IEEE JSSC, vol. 37, pp. 1396-1402, Nov. 2002.
-
(2002)
IEEE JSSC
, vol.37
, pp. 1396-1402
-
-
Tschanz, J.W.1
et., al.2
-
7
-
-
4444277442
-
Statistical Optimization of Leakage Power Considering Process Variations Using Dual-Vth and Sizing
-
June
-
A. Srivastava, D. Sylvester, and D. Blaauw, "Statistical Optimization of Leakage Power Considering Process Variations Using Dual-Vth and Sizing," in Proc. DAC, pp. 773-778, June 2004.
-
(2004)
Proc. DAC
, pp. 773-778
-
-
Srivastava, A.1
Sylvester, D.2
Blaauw, D.3
-
8
-
-
28444435971
-
Probabilistic Dual- Vth Leakage Optimization Under Variability
-
Aug
-
A. Davoodi and A. Srivastava, "Probabilistic Dual- Vth Leakage Optimization Under Variability," in Proc. ISLPED, pp. 143-148, Aug. 2005.
-
(2005)
Proc. ISLPED
, pp. 143-148
-
-
Davoodi, A.1
Srivastava, A.2
-
9
-
-
28444480744
-
A. Probabilistic Framework for Power-Optimal Repeater Insertion in Global Interconnects Under Parameter Variations
-
Aug
-
V. Wason and K. Banerjee, "A. Probabilistic Framework for Power-Optimal Repeater Insertion in Global Interconnects Under Parameter Variations," in Proc. ISLPED, pp. 131-136, Aug. 2005.
-
(2005)
Proc. ISLPED
, pp. 131-136
-
-
Wason, V.1
Banerjee, K.2
-
10
-
-
27944502914
-
Leakage Minimization of Nano-scale Circuits in the Presence of Systematic and Random Variations
-
June
-
S. Bhardwaj and S. B. K. Vrudhula, "Leakage Minimization of Nano-scale Circuits in the Presence of Systematic and Random Variations," in Proc. DAC, pp. 541-546, June 2005.
-
(2005)
Proc. DAC
, pp. 541-546
-
-
Bhardwaj, S.1
Vrudhula, S.B.K.2
-
11
-
-
34247198334
-
Considering Process Variations During System-Level Power Analysis
-
Oct
-
S. Chandra, K. Lahiri, A. Raghunathan, and S. Dey, "Considering Process Variations During System-Level Power Analysis," in Proc. ISLPED, pp. 342-345, Oct. 2006.
-
(2006)
Proc. ISLPED
, pp. 342-345
-
-
Chandra, S.1
Lahiri, K.2
Raghunathan, A.3
Dey, S.4
-
12
-
-
28244455768
-
Energy Awareness and Uncertainty in Microarchitecture-Level Design
-
Sept
-
D. Marculescu and E. Taipes, "Energy Awareness and Uncertainty in Microarchitecture-Level Design," IEEE Micro, vol. 25, pp. 64-76, Sept. 2005.
-
(2005)
IEEE Micro
, vol.25
, pp. 64-76
-
-
Marculescu, D.1
Taipes, E.2
-
13
-
-
46149102490
-
System-Level Process-Driven Variability Analysis for Single and Multiple Voltage-Frequency Island Systems
-
Nov
-
D. Marculescu and S. Garg, "System-Level Process-Driven Variability Analysis for Single and Multiple Voltage-Frequency Island Systems," in Proc. ICCAD, pp. 541-546, Nov. 2006.
-
(2006)
Proc. ICCAD
, pp. 541-546
-
-
Marculescu, D.1
Garg, S.2
-
14
-
-
27944461412
-
Variations-Aware Low-Power Design With Voltage Scaling
-
June
-
N. Azizi, M. M. Khellah, V. De, and F. N. Najm, "Variations-Aware Low-Power Design With Voltage Scaling," in Proc. DAC, pp. 529-534, June 2005.
-
(2005)
Proc. DAC
, pp. 529-534
-
-
Azizi, N.1
Khellah, M.M.2
De, V.3
Najm, F.N.4
-
15
-
-
34247281020
-
Power Efficiency for Variation-Tolerant Multicore Processors
-
Oct
-
J. Donald and M. Martonosi, "Power Efficiency for Variation-Tolerant Multicore Processors," in Proc. ISLPED, pp. 304-309, Oct. 2006.
-
(2006)
Proc. ISLPED
, pp. 304-309
-
-
Donald, J.1
Martonosi, M.2
-
16
-
-
31144433907
-
Variable Tapered Pareto Buffer Design and Implementation Allowing Run-time Configuration for Low-power Embedded SRAMs
-
Oct
-
H. Wang, M. Miranda, A. Papanikolaou, F. Catthoor, and W. Dehaene, "Variable Tapered Pareto Buffer Design and Implementation Allowing Run-time Configuration for Low-power Embedded SRAMs," IEEE Trans. VLSI Systems, vol. 13, pp. 1127-1135, Oct. 2005.
-
(2005)
IEEE Trans. VLSI Systems
, vol.13
, pp. 1127-1135
-
-
Wang, H.1
Miranda, M.2
Papanikolaou, A.3
Catthoor, F.4
Dehaene, W.5
-
17
-
-
4544298463
-
On-die CMOS Leakage Current Sensor for Measuring Process Variation in sub-90nm Generations
-
June
-
C. Kim, K. Roy, S. Shu, K. R. Krishnamurthy, and S. Borkar, "On-die CMOS Leakage Current Sensor for Measuring Process Variation in sub-90nm Generations," in Proc. Symp. on VLSI Circuits, pp. 250-251, June 2004.
-
(2004)
Proc. Symp. on VLSI Circuits
, pp. 250-251
-
-
Kim, C.1
Roy, K.2
Shu, S.3
Krishnamurthy, K.R.4
Borkar, S.5
-
18
-
-
84858086283
-
-
http://www.arm.com/products/CPUs/ARM946ES.html.
-
-
-
-
19
-
-
27944476896
-
Power Monitors: A Framework for System-level Power Estimation using Heterogeneous Power Models
-
Jan
-
N.Bansal, K.Lahiri, A.Raghunathan, and S.T.Chakradhar, "Power Monitors: A Framework for System-level Power Estimation using Heterogeneous Power Models," in Proc. Int. Conf. VLSI Design, pp. 579-585, Jan. 2005.
-
(2005)
Proc. Int. Conf. VLSI Design
, pp. 579-585
-
-
Bansal, N.1
Lahiri, K.2
Raghunathan, A.3
Chakradhar, S.T.4
-
20
-
-
9544239318
-
BACPAC - Berkeley Advanced Chip Performance Calculator
-
"BACPAC - Berkeley Advanced Chip Performance Calculator." http://www.eecs.umich.edu/~dennis/bacpac.
-
-
-
-
22
-
-
84858091488
-
-
MATLAB, High-level technical computing environment
-
"MATLAB - High-level technical computing environment." http://www.mathworks.com/produots/matlab.
-
-
-
|