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Volumn 25, Issue 5, 2005, Pages 64-76

Energy awareness and uncertainty in microarchitecture-level design

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; PROBABILITY DISTRIBUTIONS; STATISTICAL METHODS;

EID: 28244455768     PISSN: 02721732     EISSN: None     Source Type: Journal    
DOI: 10.1109/MM.2005.86     Document Type: Article
Times cited : (24)

References (14)
  • 1
    • 0036474722 scopus 로고    scopus 로고
    • "Impact of Die-to-Die and Within-Die Parameter Fluctuations on the Maximum Clock Frequency Distribution for Gigascale Integration"
    • Feb.
    • K.A. Bowman, S.G. Duvall, and J.M. Meindl, "Impact of Die-to-Die and Within-Die Parameter Fluctuations on the Maximum Clock Frequency Distribution for Gigascale Integration," IEEE J. Solid-State Circuits, vol. 37, no. 2, Feb. 2002, pp. 183-190.
    • (2002) IEEE J. Solid-State Circuits , vol.37 , Issue.2 , pp. 183-190
    • Bowman, K.A.1    Duvall, S.G.2    Meindl, J.M.3
  • 2
    • 0036858210 scopus 로고    scopus 로고
    • "Adaptive Body Bias for Reducing Impacts of Die-to-Die and Within-Die Parameter Variations on Microprocessor Frequency and Leakage"
    • Nov.
    • J. Tschanz et al., "Adaptive Body Bias for Reducing Impacts of Die-to-Die and Within-Die Parameter Variations on Microprocessor Frequency and Leakage," IEEE J. Solid-State Circuits, vol. 37, no. 11, Nov. 2002, pp. 1396-1402.
    • (2002) IEEE J. Solid-State Circuits , vol.37 , Issue.11 , pp. 1396-1402
    • Tschanz, J.1
  • 4
    • 0031342511 scopus 로고    scopus 로고
    • "The Impact of Intra-Die Device Parameter Variations on Path Delays and on the Design for Yield of Low Voltage Digital Circuits"
    • Dec.
    • M. Eisele et al., "The Impact of Intra-Die Device Parameter Variations on Path Delays and on the Design for Yield of Low Voltage Digital Circuits," IEEE Trans. Very Large Scale (VLSI) Integration Systems, vol. 5, no. 4, Dec. 1997, pp. 360-368.
    • (1997) IEEE Trans. Very Large Scale (VLSI) Integration Systems , vol.5 , Issue.4 , pp. 360-368
    • Eisele, M.1
  • 5
    • 33746585048 scopus 로고    scopus 로고
    • "Dynamic Frequency and Voltage Control for a Multiple Clock Domain Microarchitecture"
    • ACM Press
    • G. Semeraro et al., "Dynamic Frequency and Voltage Control for a Multiple Clock Domain Microarchitecture," Proc. 35th Int'l Symp. Microarchitecture (Micro 35), ACM Press, 2002, pp. 356-367.
    • (2002) Proc. 35th Int'l. Symp. Microarchitecture (Micro 35) , pp. 356-367
    • Semeraro, G.1
  • 9
    • 4444302686 scopus 로고    scopus 로고
    • "Simultaneous Optimization of Supply and Threshold Voltages for Low-Power and High-Performance Circuits in the Leakage Dominant Era"
    • ACM Press
    • A. Basu et al., "Simultaneous Optimization of Supply and Threshold Voltages for Low-Power and High-Performance Circuits in the Leakage Dominant Era," Proc. 41st Ann. ACM/IEEE Design Automation Conf. (DAC 04), ACM Press, 2004, pp. 884-887.
    • (2004) Proc. 41st Ann. ACM/IEEE Design Automation Conf. (DAC 04) , pp. 884-887
    • Basu, A.1
  • 11
    • 0003506711 scopus 로고
    • tech. report DEC WRL TN-36, DEC Western Research Laboratory
    • S. McFarling, Combining Branch Predictors, tech. report DEC WRL TN-36, DEC Western Research Laboratory, 1993.
    • (1993) Combining Branch Predictors
    • McFarling, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.