Probabilistic dual-Vth leakage optimization under variability

Proceedings of the International Symposium on Low Power Electronics and Design

Volumn , Issue , 2005, Pages 143-148

  Davoodi, Azadeh ^a   Srivastava, Ankur ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Leakage; Process Variations

Indexed keywords

ALGORITHMS; OPTIMIZATION; PROBABILISTIC LOGICS; RANDOM PROCESSES; THRESHOLD VOLTAGE;

PROCESS VARIATIONS; RUNTIME CONTROL; TIMING CONSTRAINT; VOLTAGE ASSIGNMENT;

LEAKAGE CURRENTS;

EID: 28444435971     PISSN: 15334678     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/lpe.2005.195504     Document Type: Conference Paper

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