A probabilistic framework for power-optimal repeater insertion in global interconnects under parameter variations

Proceedings of the International Symposium on Low Power Electronics and Design

Volumn , Issue , 2005, Pages 131-136

  Wason, Vineet ^a   Banerjee, Kaustav ^a  

^a University of California   (United States)

Author keywords

Buffer interconnect system; Parameter variations; Sensitivity analysis; Statistical delay and power models; Statistical optimization

Indexed keywords

ELECTRIC POWER SYSTEM INTERCONNECTION; INSERTION LOSSES; OPTIMIZATION; PROBABILISTIC LOGICS; SENSITIVITY ANALYSIS; STATISTICAL METHODS; TELECOMMUNICATION REPEATERS;

BUFFER-INTYERCONNECT SYSTEM; PARAMETER VARIATIONS; STATISTICAL OPTIMIZATION; STATSITICAL DELAY AND POWER MODEL;

POWER ELECTRONICS;

EID: 28444480744     PISSN: 15334678     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/lpe.2005.195502     Document Type: Conference Paper

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