In-situ delay characterization and local supply voltage adjustment for compensation of local parametric variations

IEEE Journal of Solid-State Circuits

Volumn 42, Issue 7, 2007, Pages 1583-1592

  Eireiner, Matthias ^a,b   Henzler, Stephan ^a,c   Georgakos, Georg ^c   Berthold, Joerg ^c   Schmitt Landsiedel, Doris ^a,b  

^a IEEE   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

Adaptive supply voltage (ASV); Crystal ball flip flop; Dynamic voltage scaling (DVS); Error detection and correction, in situ characterization; Local supply voltage assignment; Razor flip flop

Indexed keywords

DYNAMIC VOLTAGE SCALING (DVS); LOCAL SUPPLY VOLTAGE ASSIGNMENT; PARAMETRIC VARIATIONS; POWER SWITCH SCHEME; RAZOR FLIP-FLOP; SUPPLY VOLTAGE;

CHARACTERIZATION; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DELAY CIRCUITS; ELECTRIC POTENTIAL; MONTE CARLO METHODS;

PARAMETRIC DEVICES;

EID: 34347233021     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2007.896695     Document Type: Conference Paper

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