Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue SUPPL., 2002, Pages 344-345+538

  Tschanz, James ^a   Kao, James ^a   Narendra, Siva ^a   Nair, Raj ^a   Antoniadis, Dimitri ^a   Chandrakasan, Anantha ^a   De, Vivek ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; LEAKAGE CURRENTS; SIGNAL GENERATORS; SPURIOUS SIGNAL NOISE;

PHASE DETECTORS;

MICROPROCESSOR CHIPS;

EID: 0036228564     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)