Cost reduction and evaluation of a temporary faults detecting technique

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2000, Pages 591-598

  Anghel, Lorena ^a   Nicolaidis, Michael ^a  

^a TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ARITHMETIC CIRCUIT; CHANNEL WIDTHS; DETECTING TECHNIQUE; FAULT TOLERANT TECHNIQUE; PERFORMANCE COSTS; TEMPORARY FAULT; TIME REDUNDANCY; TIMING ERRORS;

AUTOMOBILE MANUFACTURE; RADIATION HARDENING;

EXHIBITIONS;

EID: 33847113086     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2000.840845     Document Type: Conference Paper

References (15)

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