Analytical models for crosstalk excitation and propagation in VLSI circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 21, Issue 10, 2002, Pages 1117-1131

  Chen, Wei Yu ^b,c   Gupta, Sandeep K ^a,b   Breuer, Melvin A ^a,b  

^a IEEE

^b University of Southern California ^*  (United States)

^c SUN MICROSYSTEMS   (United States)

Author keywords

Crosstalk; Delay; Noise; Pulses; Test generation

Indexed keywords

CROSSTALK; ELECTRIC INVERTERS; ELECTRIC NETWORK ANALYSIS; EQUIVALENT CIRCUITS; LAPLACE TRANSFORMS; LOGIC GATES; MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE; TRANSFER FUNCTIONS; WAVEFORM ANALYSIS;

AUTOMATIC TEST PATTERN GENERATION; CAPACITIVE COUPLING; EQUIVALENT INVERTER; SOFTWARE PACKAGE SPICE;

VLSI CIRCUITS;

EID: 0036810746     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2002.802276     Document Type: Article

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