Scaling, power, and the future of CMOS

Technical Digest - International Electron Devices Meeting, IEDM

Volumn 2005, Issue , 2005, Pages 9-15

  Horowitz, Mark ^a   Alon, Elad ^a   Patil, Dinesh ^a   Naffziger, Samuel ^b   Kumar, Rajesh ^b   Bernstein, Kerry ^c  

^a STANFORD UNIVERSITY   (United States)

^b INTEL CORPORATION   (United States)

^c IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33847708700     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (33)

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