Predictions of CMOS compatible on-chip optical interconnect

Integration, the VLSI Journal

Volumn 40, Issue 4, 2007, Pages 434-446

  Chen, Guoqing ^a   Chen, Hui ^b   Haurylau, Mikhail ^a   Nelson, Nicholas A ^a   Albonesi, David H ^c   Fauchet, Philippe M ^a   Friedman, Eby G ^a  

^a University of Rochester   (United States)

^b UNIVERSITY OF ROCHESTER   (United States)

^c School of Chemical and Molecular Engineering   (United States)

Author keywords

CMOS compatible; On chip; Optical interconnect; Trends

Indexed keywords

BANDWIDTH; COPPER; MICROPROCESSOR CHIPS; OPTICAL INTERCONNECTS; UNCERTAINTY ANALYSIS;

CONVENTIONAL COPPER INTERCONNECT; ELECTRICAL INTERCONNECTS; ENVIRONMENTAL VARIATIONS; ON-CHIP OPTICAL INTERCONNECTS;

CMOS INTEGRATED CIRCUITS;

EID: 34249051162     PISSN: 01679260     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vlsi.2006.10.001     Document Type: Article

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