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Volumn 2006, Issue , 2006, Pages

Dose designing and fabrication of 4H-SiC double RESURF MOSFETs

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT SIMULATION; ELECTRIC BREAKDOWN; ELECTRONIC STRUCTURE; INTEGRATED CIRCUIT LAYOUT; MICROFABRICATION; SILICON CARBIDE;

EID: 34247516100     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (18)
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    • D. Peters, R. Schörner, P. Friedrichs, and D. Stephani, "4H-SiC Power MOSFET Blocking 1200 V with a date Technology Compatible with Industrial Applications", Mater. Sci. Forum, vols. 433-436, pp. 769-772, 2003.
    • (2003) Mater. Sci. Forum , vol.433-436 , pp. 769-772
    • Peters, D.1    Schörner, R.2    Friedrichs, P.3    Stephani, D.4
  • 4
    • 5544272753 scopus 로고    scopus 로고
    • A Self-Aligned Process for High-Voltage, Short-Channel Vertical DMOSFETs in 4H-SiC
    • M. Matin, A. Saha, and J.A. Cooper, "A Self-Aligned Process for High-Voltage, Short-Channel Vertical DMOSFETs in 4H-SiC", IEEE Trans. Electron Devices, vol. 51, pp. 1721-1725, 2004.
    • (2004) IEEE Trans. Electron Devices , vol.51 , pp. 1721-1725
    • Matin, M.1    Saha, A.2    Cooper, J.A.3
  • 6
    • 0018714042 scopus 로고
    • High Voltage Thin Layer Devices (RESURF Devices)
    • J. Appels and H.M.J. Vaes, "High Voltage Thin Layer Devices (RESURF Devices)", IEDM Tech. Dig., pp. 238-241, 1979.
    • (1979) IEDM Tech. Dig , pp. 238-241
    • Appels, J.1    Vaes, H.M.J.2
  • 7
    • 0036805048 scopus 로고    scopus 로고
    • 1300-V 6H-SiC Lateral MOSFETs with Two RESURF Zones
    • S. Baneijee, T.P. Chow, and R.J. Gutmann, "1300-V 6H-SiC Lateral MOSFETs with Two RESURF Zones", IEEE Electron Device Lett., vol. 23, pp. 624-626, 2002.
    • (2002) IEEE Electron Device Lett , vol.23 , pp. 624-626
    • Baneijee, S.1    Chow, T.P.2    Gutmann, R.J.3
  • 9
    • 12344276948 scopus 로고    scopus 로고
    • Design and Fabrication of RESURF MOSFETs on 4H-SiC (0001), (1120), and 6H-SiC
    • T. Kimoto, H. Kosugi, J. Suda, Y. Kanzaki, and H. Matsunami, "Design and Fabrication of RESURF MOSFETs on 4H-SiC (0001), (1120), and 6H-SiC (0001)", IEEE Electron Devices, vol. 52, pp. 112-117, 2005.
    • (2005) IEEE Electron Devices , vol.52 , pp. 112-117
    • Kimoto, T.1    Kosugi, H.2    Suda, J.3    Kanzaki, Y.4    Matsunami, H.5
  • 10
    • 0035890602 scopus 로고    scopus 로고
    • Effects of Nitridation in Gate Oxides Grown on 4H-SiC
    • P. Jamet, S. Dimitrijev, and P. Tanner, "Effects of Nitridation in Gate Oxides Grown on 4H-SiC", J. Appl. Phys., vol. 90, pp. 5058-5063, 2001.
    • (2001) J. Appl. Phys , vol.90 , pp. 5058-5063
    • Jamet, P.1    Dimitrijev, S.2    Tanner, P.3
  • 13
    • 1942540794 scopus 로고    scopus 로고
    • Effect of Gate Oxidation Method on Electrical Properties of Metal-Oxide-Semiconductor Field-Effect Transistors Fabricated on 4H-SiC C(0001̄) Face
    • K. Fukuda, M. Kato, K. Kojima, and J. Senzaki, "Effect of Gate Oxidation Method on Electrical Properties of Metal-Oxide-Semiconductor Field-Effect Transistors Fabricated on 4H-SiC C(0001̄) Face", Appl. Phys. Lett., vol. 84, pp. 2088-2090, 2004.
    • (2004) Appl. Phys. Lett , vol.84 , pp. 2088-2090
    • Fukuda, K.1    Kato, M.2    Kojima, K.3    Senzaki, J.4
  • 14
    • 0033357890 scopus 로고    scopus 로고
    • High Channel Mobility in Inversion Layers of 4H-SiC MOSFET's by Utilizing (1120) Face
    • H. Yano, H. Hirao, T. Kimoto, H. Matsunami, K. Asano, and Y. Sugawara, "High Channel Mobility in Inversion Layers of 4H-SiC MOSFET's by Utilizing (1120) Face", IEEE Electron Device Lett., vol. 20, pp. 611-613, 1999.
    • (1999) IEEE Electron Device Lett , vol.20 , pp. 611-613
    • Yano, H.1    Hirao, H.2    Kimoto, T.3    Matsunami, H.4    Asano, K.5    Sugawara, Y.6
  • 16
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    • Electronic Behaviors of High-Dose Phosphorus-Ion Implanted 4H-SiC
    • Y. Negoro, K. Katsumoto, T. Kimoto, and H. Matsunami, "Electronic Behaviors of High-Dose Phosphorus-Ion Implanted 4H-SiC (0001)", J. Appl. Phys., vol. 96, pp. 224-228, 2004.
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    • Negoro, Y.1    Katsumoto, K.2    Kimoto, T.3    Matsunami, H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.