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Volumn , Issue , 2005, Pages 676-681

A new method for design of robust digital circuits

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT OPTIMIZATION; COMPUTATIONALLY EFFICIENT; ENVIRONMENTAL VARIATIONS; GEOMETRIC PROGRAMMING; MONTE-CARLO SIMULATIONS; PERFORMANCE VARIATIONS; POLYNOMIAL FUNCTIONS; STANDARD DEVIATION;

EID: 84886702569     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2005.11     Document Type: Conference Paper
Times cited : (48)

References (21)
  • 4
    • 0032272376 scopus 로고    scopus 로고
    • Within-chip variability analysis
    • S. Nassif, "Within-chip variability analysis", Proc. of IEDM, 1998, p. 283.
    • (1998) Proc. of IEDM , pp. 283
    • Nassif, S.1
  • 5
    • 0031275325 scopus 로고    scopus 로고
    • Predicting CMOS speed with gate oxide and voltage scaling and interconnect loading effects
    • November
    • K. Chen, C. Hu, P. Fang, M. Lin, and D. Wollesen, "Predicting CMOS speed with gate oxide and voltage scaling and interconnect loading effects", IEEE Transactions on Electron Devices, pp. 1951-1957, November 1997.
    • (1997) IEEE Transactions on Electron Devices , pp. 1951-1957
    • Chen, K.1    Hu, C.2    Fang, P.3    Lin, M.4    Wollesen, D.5
  • 15
    • 4444333242 scopus 로고    scopus 로고
    • A methodology to improve timing yield in the presence of process variations
    • S. Raj, S. Vrudhula, and J. Wang, "A methodology to improve timing yield in the presence of process variations", Proc. Design Automation Conference (DAC), 2004, pp. 448-453.
    • (2004) Proc. Design Automation Conference (DAC) , pp. 448-453
    • Raj, S.1    Vrudhula, S.2    Wang, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.