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Physical Review B - Condensed Matter and Materials Physics

Volumn 74, Issue 8, 2006, Pages

Electrostatic forces acting on tip and cantilever in atomic force microscopy

(3) Bonaccurso, Elmar a Schönfeld, Friedhelm b Butt, Hans Jürgen a

a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH (Germany)

b INSTITUT FÜR MIKROTECHNIK MAINZ GMBH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33747618645 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.74.085413 Document Type: Article

Times cited : (35)

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