Enhancing delay fault coverage through low power segmented scan

Proceedings - Eleventh IEEE European Test Symposium, ETS 2006

Volumn 2006, Issue , 2006, Pages 21-26

  Zhuo, Zhang ^a   Reddy, Sudhakar M ^a   Pomeranz, Irith ^b   Rajski, Janusz ^c   Al Hashimi, Bashir M ^d  

^a UNIVERSITY OF IOWA   (United States)

^b PURDUE UNIVERSITY   (United States)

^c MENTOR GRAPHICS CORPORATION   (United States)

^d UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DELAY FAULT COVERAGE; MANUFACTURING TESTS; PEAK SWITCHING ACTIVITY;

DESIGN FOR TESTABILITY; INDUSTRIAL RESEARCH; PRODUCT DESIGN; QUALITY CONTROL; SWITCHING;

POWER CONTROL;

EID: 33845417242     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2006.18     Document Type: Conference Paper

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