Design for testability: Using scanpath techniques for path-delay test and measurement

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 365-374

  Dervisoglu, Bulent I ^a   Stong, Gayvin E ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; FLIP FLOP CIRCUITS; LOGIC CIRCUITS;

INPUT/OUTPUT DELAYS; PATH DELAY DEPTHS; SCAN PATH TECHNIQUES;

ELECTRON DEVICE TESTING;

EID: 0026676975     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)