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Volumn 1992-January, Issue , 1992, Pages 705-713
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Skewed-Load Transition Test: Part I, Calculus
a
a
IBM
(United States)
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Author keywords
Calculus; Circuit faults; Circuit testing; Clocks; Delay effects; Electrical fault detection; Fault detection; Logic circuits; Logic testing; Propagation delay
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Indexed keywords
CALCULATIONS;
CHAINS;
CLOCKS;
COMPUTATION THEORY;
COMPUTER CIRCUITS;
DELAY CIRCUITS;
ELECTRIC FAULT LOCATION;
FAULT DETECTION;
INTEGRATED CIRCUIT TESTING;
RECONFIGURABLE HARDWARE;
TESTING;
VECTORS;
CALCULUS;
CIRCUIT FAULTS;
CIRCUIT TESTING;
DELAY EFFECTS;
ELECTRICAL FAULT DETECTIONS;
LOGIC TESTING;
PROPAGATION DELAYS;
LOGIC CIRCUITS;
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EID: 84961244022
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/TEST.1992.527892 Document Type: Conference Paper |
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Times cited : (124)
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References (0)
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