On the generation of scan-based test sets with reachable states for testing under functional operation conditions

Proceedings - Design Automation Conference

Volumn , Issue , 2004, Pages 928-933

  Pomeranz, Irith ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

Functional tests; Reachable states; Scan design

Indexed keywords

FUNCTIONAL TESTS; POWER DISSIPATION; REACHABLE STATES; SCAN DESIGN;

COMPUTER SIMULATION; FAULT TOLERANT COMPUTER SYSTEMS; NETWORKS (CIRCUITS); REDUNDANCY; RELIABILITY; SYNCHRONOUS MACHINERY; TEST FACILITIES;

DESIGN FOR TESTABILITY;

EID: 4444353537     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.2004.239783     Document Type: Conference Paper

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