On a software-based self-test methodology and its application

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2005, Pages 107-113

  Wen, Charles H P ^a   Wang, Li C ^a   Cheng, Kwang Ting ^a   Yang, Kai ^a   Liu, Wei Ting ^b   Chen, Ji Jan ^b  

^a University of California   (United States)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT LIMITATION; DEFECT COVERAGE; FUNCTIONAL TEST PATTERNS; FUNCTIONAL TESTING; ITS APPLICATIONS; MICROPROCESSOR CORE; SOFTWARE-BASED SELF-TEST; VERIFICATION TESTS;

TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 33750139525     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2005.59     Document Type: Conference Paper

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