Multiplicative window generators of pseudo-random test vectors

Proceedings of European Design and Test Conference

Volumn , Issue , 1996, Pages 42-48

  Rajski, Janusz ^a   Tyszer, Jerzy ^a  

^a MENTOR GRAPHICS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; VECTORS;

ARITHMETIC BUILT IN SELF TEST (ABIST) ENVIRONMENT; MULTIPLICATIVE WINDOW GENERATORS; PSEUDO RANDOM TEST VECTORS;

APPLICATION SPECIFIC INTEGRATED CIRCUITS;

EID: 0029757824     PISSN: 10661409     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)