Effective software self-test methodology for processor cores

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2002, Pages 592-597

  Kranitis, N ^a   Paschalis, A ^a   Gizopoulos, D ^b   Zorian, Y ^c  

^a UNIVERSITY OF ATHENS   (Greece)

^b UNIVERSITY OF PIRAEUS   (Greece)

^c LogicVision Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EMBEDDED PROCESSORS; FUNCTIONAL TESTING; MEMORY REQUIREMENTS; REGISTER TRANSFER; STRUCTURAL TESTING; TEST APPLICATION TIME; TEST DEVELOPMENT; TEST RESOURCE PARTITIONING;

EXHIBITIONS; INTEGRATED CIRCUIT TESTING;

SOFTWARE TESTING;

EID: 84893783985     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2002.998361     Document Type: Conference Paper

References (13)

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