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Volumn , Issue , 2004, Pages 92-97

TranGen: A SAT-based ATPG for path-oriented transition faults

Author keywords

[No Author keywords available]

Indexed keywords

DELAY TESTING; FALSE-PATH PRUNING; GATE DELAY MODELS; MULTIPLE-DETECTION TRANSITION;

EID: 2442536097     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (64)

References (26)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.