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Volumn 2002-January, Issue , 2002, Pages 223-228
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Instruction-based self-testing of processor cores
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Author keywords
Application software; Automatic testing; Built in self test; Frequency; Informatics; Integrated circuit testing; Logic testing; Software testing; System testing; Test pattern generators
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Indexed keywords
APPLICATION PROGRAMS;
AUTOMATIC TESTING;
BENCHMARKING;
COMPUTER ARCHITECTURE;
EMBEDDED SYSTEMS;
INTEGRATED CIRCUIT TESTING;
MICROPROCESSOR CHIPS;
PROGRAMMABLE LOGIC CONTROLLERS;
SOFTWARE TESTING;
SYSTEM-ON-CHIP;
FREQUENCY;
INFORMATICS;
LOGIC TESTING;
SYSTEM TESTING;
TEST PATTERN GENERATOR;
BUILT-IN SELF TEST;
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EID: 0043195905
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/VTS.2002.1011142 Document Type: Conference Paper |
Times cited : (39)
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References (8)
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