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Volumn 2002-January, Issue , 2002, Pages 223-228

Instruction-based self-testing of processor cores

Author keywords

Application software; Automatic testing; Built in self test; Frequency; Informatics; Integrated circuit testing; Logic testing; Software testing; System testing; Test pattern generators

Indexed keywords

APPLICATION PROGRAMS; AUTOMATIC TESTING; BENCHMARKING; COMPUTER ARCHITECTURE; EMBEDDED SYSTEMS; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; PROGRAMMABLE LOGIC CONTROLLERS; SOFTWARE TESTING; SYSTEM-ON-CHIP;

EID: 0043195905     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2002.1011142     Document Type: Conference Paper
Times cited : (39)

References (8)
  • 2
    • 0032306939 scopus 로고    scopus 로고
    • Native mode functional test generation for processors with applications to selftest and design validation
    • J.Shen, J.Abraham, "Native mode functional test generation for processors with applications to selftest and design validation", in Proceedings of the International Test Conference 1998, pp. 990-999.
    • Proceedings of the International Test Conference 1998 , pp. 990-999
    • Shen, J.1    Abraham, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.