Transistor scaling with novel materials

Materials Today

Volumn 9, Issue 6, 2006, Pages 26-31

  Ieong, Meikei ^a   Narayanan, Vijay ^a   Singh, Dinkar ^a   Topol, Anna ^a   Chan, Victor ^a   Ren, Zhibin ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATION; MATERIALS SCIENCE; PERFORMANCE; SEMICONDUCTOR DEVICE MANUFACTURE; TRANSISTORS;

NOVEL MATERIALS; PERFORMANCE TREND; TRANSISTOR SCALING; TRANSISTOR STRUCTURES;

CMOS INTEGRATED CIRCUITS;

EID: 33646895440     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(06)71540-1     Document Type: Article

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