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Volumn 8, Issue 1, 2006, Pages 33-42

X-ray microanalytical techniques based on synchrotron radiation

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; URANIUM;

EID: 33644840099     PISSN: 14640325     EISSN: None     Source Type: Journal    
DOI: 10.1039/b511446m     Document Type: Conference Paper
Times cited : (63)

References (79)
  • 7
    • 0002268221 scopus 로고
    • ed. P. J. Duke and A. G. Michette, Plenum, New York
    • D. Rudolph, G. Schmahl and B. Niemann, in Modern Microscopes, ed. P. J. Duke and A. G. Michette, Plenum, New York, 1990, pp. 59-67.
    • (1990) Modern Microscopes , pp. 59-67
    • Rudolph, D.1    Schmahl, G.2    Niemann, B.3
  • 10
    • 0043007351 scopus 로고
    • ed. V. V. Aristov and A. I. Erko, Bogorodski Pechatnik, Cherngolovka, Moscow region
    • M. R. Howells, C. J. Jakobsen and S. Lindaas, in X-ray Microscopy IV, ed. V. V. Aristov and A. I. Erko, Bogorodski Pechatnik, Cherngolovka, Moscow region, 1994, p. 414.
    • (1994) X-ray Microscopy IV , pp. 414
    • Howells, M.R.1    Jakobsen, C.J.2    Lindaas, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.