An X-ray nanodiffraction technique for structural characterization of individual nanomaterials

Journal of Synchrotron Radiation

Volumn 12, Issue 2, 2005, Pages 124-128

  Xiao, Y ^a   Cai, Z ^a   Wang, Z L ^b   Lai, B ^a   Chu, Y S ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b Georgia Institute of Technology   (United States)

Author keywords

X ray microprobe; X ray nanodiffraction

Indexed keywords

CHARACTERIZATION; NANOSTRUCTURED MATERIALS; PHOTONS; SYNCHROTRON RADIATION; X RAYS;

DIFFRACTION SIGNALS; PHOTON FLUX; X-RAY MICROPROBES; X-RAY NANODIFFRACTION;

X RAY DIFFRACTION;

EID: 27644570644     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049504028596     Document Type: Conference Paper

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