Hard X-ray full field microscopy and magnifying microtomography using compound refractive lenses

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue PART II, 2001, Pages 966-969

  Schroer, Christian G ^a   Günzler, Til Florian ^a   Benner, Boris ^a   Kuhlmann, Marion ^a   Tümmler, Johannes ^a   Lengeler, Bruno ^a   Rau, Christoph ^b   Weitkamp, Timm ^b   Snigirev, Anatoly ^b   Snigireva, Irina ^b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Compound refractive lenses; Hard X ray microscope; Tomography

Indexed keywords

EID: 21844435734     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00542-3     Document Type: Article

References (7)

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6. C.G. Schroer, B. Lengeler, B. Benner, J. Tümmler, T.F. Günzler, M. Drakopoulos, A. Snigirev, I. Snigireva, In: W. Meyer-Ilse, T. Warwick, D. Attwood (Eds.), X-Ray Microscopy: Proceedings of the Sixth International Conference, Vol. 507 of AIP Conference Proceedings (2000).
7. T. Weitkamp, M. Drakopoulos, W. Leitenberger, C. Raven, C.G. Schroer, A.S. Simionovici, I. Snigireva, A. Snigirev, In: W. Meyer-Ilse, T. Warwick, D. Attwood (Eds.), X-Ray Microscopy: Proceedings of the Sixth International Conference, Vol. 507 of AIP Conference Proceedings (2000).