Nanotomography based on hard x-ray microscopy with refractive lenses

Applied Physics Letters

Volumn 81, Issue 8, 2002, Pages 1527-1529

  Schroer, C G ^a   Meyer, J ^a   Kuhlmann, M ^a   Benner, B ^a   Gunzler T F ^a   Lengeler, B ^a   Rau, C ^b   Weitkamp, T ^b   Snigirev, A ^b   Snigireva, I ^b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

HARD X RAY; NANOTOMOGRAPHY; PARABOLIC REFRACTIVE X-RAY LENS; REFRACTIVE LENS; SUBMICROMETER RESOLUTION; TEST SAMPLES; THREE-DIMENSIONAL RECONSTRUCTION; THREE-DIMENSIONAL STRUCTURE;

BERYLLIUM; NUMERICAL METHODS; OPTICAL INSTRUMENT LENSES; X RAY MICROSCOPES; X RAYS;

THREE DIMENSIONAL;

EID: 79955988225     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1501451     Document Type: Article

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