Fluorescence microtomography using nanofocusing refractive X-ray lenses

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5535, Issue , 2004, Pages 162-168

  Schroer, C G ^a,b   Gunzler T F ^a   Kuhlmann, M ^a   Kurapova, O ^a   Feste, S ^a   Schweitzer, M ^a   Lengeler, B ^a   Schroder W H ^c   Drakopoulos, M ^d,e   Somogyi, A ^d   Simionovici, A S ^d   Snigirev, A ^d   Snigireva, I ^d  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b DESY   (Germany)

^c FORSCHUNGSZENTRUM JÜLICH   (Germany)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^e RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

Refractive x ray lenses; Scanning x ray microscopy; Tomography; X ray fluorescence

Indexed keywords

FLUORESCENCE; LIGHT; OPTICAL RESOLVING POWER; REFRACTION; SYNCHROTRON RADIATION; TOMOGRAPHY; X RAYS;

MICROTOMOGRAPHY; REFRACTIVE X-RAY LENSES; SCANNING X-RAY MICROSCOPY; X-RAY FLUORESCENCE;

LENSES;

EID: 20144384616     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.559679     Document Type: Conference Paper

References (18)

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