Magnified hard x-ray microtomography: Toward tomography with sub-micron resolution

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4503, Issue , 2001, Pages 23-33

  Schroer, Christian G ^a   Benner, Boris ^a   Günzler, Til Florian ^a   Kuhlmann, Marion ^a   Lengeler, Bruno ^a   Rau, Christoph ^b   Weitkamp, Timm ^b   Snigirev, Anatoly ^b   Snigireva, Irina ^b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Compound refractive lenses; Contrast formation; Full field imaging; Hard x ray microscope; Tomography

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; DATA ACQUISITION; IMAGE RECONSTRUCTION; IMAGING TECHNIQUES; OPTICAL INSTRUMENT LENSES; X RAY OPTICS;

PARABOLIC COMPOUND REFRACTIVE LENSES (PCRL);

TOMOGRAPHY;

EID: 0035762314     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.452858     Document Type: Article

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