SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 600, Issue 3, 2006, Pages 716-723

Chemical fingerprinting at the atomic level with scanning tunneling spectroscopy

(5) Nakayama, Koji S a,b Sugano, Tomoko a,c Ohmori, Kenji a,d Signor, A W a Weaver, J H a

a United States of America (United States)

b TOHOKU UNIVERSITY (Japan)

c Japan Patent Office (Japan)

d NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

Chemical identification; Local density of states; Scanning tunneling spectroscopy; Si(0 0 1) with adsorbed halogens

Indexed keywords

BROMINE; CHLORINE; ELECTRONIC DENSITY OF STATES; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACE STRUCTURE;

ADSORBATES; CHEMICAL FINGERPRINTING; CHEMICAL IDENTIFICATION;

HALOGEN ELEMENTS;

EID: 31744432438 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2005.11.032 Document Type: Article

Times cited : (9)

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