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Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 23, 2001, Pages 2353101-2353106

Fine electronic structure of the buckled dimers of Si(100) elucidated by atomically resolved scanning tunneling spectroscopy and bias-dependent imaging

(3) Hata, Kenji a Shibata, Yasunori a Shigekawa, Hidemi a

a UNIVERSITY OF TSUKUBA (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIMER; SILICON;

ARTICLE; ATOM; ELECTRON; ENERGY; SCANNING TUNNELING MICROSCOPY; SCANNING TUNNELING SPECTROSCOPY; SURFACE CHARGE; TEMPERATURE;

EID: 0035893978 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/physrevb.64.235310 Document Type: Article

Times cited : (43)

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