Detailed analysis of scanning tunneling microscopy images of the Si(001) reconstructed surface with buckled dimers

Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 19, 2001, Pages

  Okada, Hiromi ^a   Fujimoto, Yoshitaka ^a   Endo, Katsuyoshi ^a   Hirose, Kikuji ^a   Mori, Yuzo ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; CHEMICAL BOND; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; MATHEMATICAL ANALYSIS; SCANNING TUNNELING MICROSCOPY; SIMULATION; STRUCTURE ANALYSIS;

EID: 0034895368     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.195324     Document Type: Article

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