Chemisorption-induced disruption of surface electronic structure: Hydrogen adsorption on the Si(100)-2 × 1 surface

Physical Review B - Condensed Matter and Materials Physics

Volumn 65, Issue 16, 2002, Pages 1653361-1653365

  Chen, Dongxue ^a   Boland, John J ^a  

^a The University of North Carolina at Chapel Hill   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGEN; SILICON;

ADSORPTION; ARTICLE; CALCULATION; ELECTRON; GEOMETRY; HYDROGENATION; SCANNING TUNNELING MICROSCOPY;

EID: 0037091424     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (16)