Atom-resolved three-dimensional mapping of boron dopants in Si(100) by scanning tunneling microscopy

Applied Physics Letters

Volumn 78, Issue 3, 2001, Pages 386-388

  Liu, Lequn ^a   Yu, Jixin ^a   Lyding, J W ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000658159     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1339260     Document Type: Article

References (13)

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