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Volumn 59, Issue 11, 1999, Pages 7293-7296
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View of the empty states of the Si(100)-(2×1) surface via scanning tunneling microscopy imaging at very low biases
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 17044414577
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.59.7293 Document Type: Article |
Times cited : (47)
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References (22)
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