Carrier diffusion in microcrystalline silicon studied by the picosecond laser induced grating technique

Applied Physics Letters

Volumn 79, Issue 5, 2001, Pages 626-628

  Kudrna, J ^a   Trojanek F ^a   Maly P ^a   Pelant, I ^b  

^a CHARLES UNIVERSITY   (Czech Republic)

^b INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038844214     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1381418     Document Type: Article

References (12)

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