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Volumn 299-302, Issue PART 1, 2002, Pages 355-359
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Model of transport in microcrystalline silicon
a a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVATION ENERGY;
AGGREGATES;
ATOMIC FORCE MICROSCOPY;
CRYSTAL MICROSTRUCTURE;
ELECTRIC CONDUCTIVITY;
ELECTRON TRANSPORT PROPERTIES;
SURFACE ROUGHNESS;
MICROCRYSTALLINE SILICON;
SEMICONDUCTING SILICON;
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EID: 0036538972
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3093(02)00931-6 Document Type: Conference Paper |
Times cited : (54)
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References (16)
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