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Volumn 299-302, Issue PART 1, 2002, Pages 355-359

Model of transport in microcrystalline silicon

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; AGGREGATES; ATOMIC FORCE MICROSCOPY; CRYSTAL MICROSTRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRON TRANSPORT PROPERTIES; SURFACE ROUGHNESS;

EID: 0036538972     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(02)00931-6     Document Type: Conference Paper
Times cited : (54)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.