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Volumn 75, Issue 4, 1999, Pages 498-500
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Dynamics of the excimer laser annealing of hydrogenated amorphous silicon thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS SILICON;
ANNEALING;
CRYSTALLIZATION;
ELECTRIC CONDUCTIVITY MEASUREMENT;
EXCIMER LASERS;
LASER PULSES;
MELTING;
RAMAN SPECTROSCOPY;
THIN FILMS;
HYDROGENATED AMORPHOUS SILICON;
LASER ANNEALING;
TIME-RESOLVED CONDUCTIVITY (TRC) SPECTROSCOPY;
TIME-RESOLVED REFLECTIVITY (TRR) SPECTROSCOPY;
AMORPHOUS FILMS;
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EID: 0032607019
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.124428 Document Type: Article |
Times cited : (17)
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References (14)
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