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Volumn 84, Issue 21, 2000, Pages 4946-4949
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Extraction current transients: New method of study of charge transport in microcrystalline silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0037511140
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.84.4946 Document Type: Article |
Times cited : (399)
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References (6)
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