In situ correlation between the optical and electrical properties of thin intrinsic and n-type microcrystalline silicon films

Journal of Applied Physics

Volumn 81, Issue 11, 1997, Pages 7282-7288

  Hamma, S ^a   Roca I Cabarrocas, P ^a  

^a LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000098345     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365325     Document Type: Article

References (24)

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