메뉴 건너뛰기




Volumn 5, Issue 1, 2006, Pages 37-41

Simulation of a Ge-Si hetero-nanocrystal memory

Author keywords

Erasing; Hetero nanocrystal memory; Programming; Retention

Indexed keywords

ERASING; HETERO-NANOCRYSTAL MEMORY; PROGRAMMING; RETENTION;

EID: 31144456480     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2005.861405     Document Type: Article
Times cited : (20)

References (23)
  • 1
    • 0031039096 scopus 로고    scopus 로고
    • A silicon single-electron transistor memory operating at room temperature
    • L. Guo, E. Leobandung, and S. Y. Chou, "A silicon single-electron transistor memory operating at room temperature," Science, vol. 275, pp. 649-651, 1997.
    • (1997) Science , vol.275 , pp. 649-651
    • Guo, L.1    Leobandung, E.2    Chou, S.Y.3
  • 3
    • 0031167986 scopus 로고    scopus 로고
    • Room temperature operation of a quantum-dot flash memory
    • Jun.
    • J. J. Welser, S. Tiwari, S. Rishton, K. Y. Lee, and Y. Lee, "Room temperature operation of a quantum-dot flash memory," IEEE Electron Device Lett., vol. 18, no. 6, pp. 278-280, Jun. 1997.
    • (1997) IEEE Electron Device Lett. , vol.18 , Issue.6 , pp. 278-280
    • Welser, J.J.1    Tiwari, S.2    Rishton, S.3    Lee, K.Y.4    Lee, Y.5
  • 4
    • 0001182140 scopus 로고    scopus 로고
    • Effects of traps on charge storage characteristics in metal-oxide-semiconductor memory structures based on silicon nanocrystals
    • Y. Shi, K. Saito, H. Ishikuro, and T. Hiramoto, "Effects of traps on charge storage characteristics in metal-oxide-semiconductor memory structures based on silicon nanocrystals," J. Appl. Phys., vol. 84, pp. 2358-2360, 1998.
    • (1998) J. Appl. Phys. , vol.84 , pp. 2358-2360
    • Shi, Y.1    Saito, K.2    Ishikuro, H.3    Hiramoto, T.4
  • 7
    • 0032186930 scopus 로고    scopus 로고
    • Tunneling leakage current in ultrathin (<4 nm) nitride/oxide stack dielectrics
    • Oct.
    • Y. Shi, X. W. Wang, and T. P. Ma, "Tunneling leakage current in ultrathin (<4 nm) nitride/oxide stack dielectrics," IEEE Electron Device Lett., vol. 19, no. 10, pp. 388-390. Oct. 1998.
    • (1998) IEEE Electron Device Lett. , vol.19 , Issue.10 , pp. 388-390
    • Shi, Y.1    Wang, X.W.2    Ma, T.P.3
  • 8
    • 0000090297 scopus 로고    scopus 로고
    • Layered tunnel barriers for nonvolatile memory devices
    • K. K. Likharev, "Layered tunnel barriers for nonvolatile memory devices," Appl. Phys. Lett., vol. 73, pp. 2137-2139, 1998.
    • (1998) Appl. Phys. Lett. , vol.73 , pp. 2137-2139
    • Likharev, K.K.1
  • 9
    • 0033080161 scopus 로고    scopus 로고
    • Electrical properties of high-quality ultrathin nitride/oxide stack dielectrics
    • Feb.
    • Y. Shi, X. W. Wang, and T. P. Ma, "Electrical properties of high-quality ultrathin nitride/oxide stack dielectrics," IEEE Trans. Electron Devices, vol. 46, no. 2, pp. 362-368, Feb. 1999.
    • (1999) IEEE Trans. Electron Devices , vol.46 , Issue.2 , pp. 362-368
    • Shi, Y.1    Wang, X.W.2    Ma, T.P.3
  • 10
    • 0036639637 scopus 로고    scopus 로고
    • Materials issues for layered tunnel barrier structures
    • J. D. Casperson, L. D. Bell, and H. A. Atwater, "Materials issues for layered tunnel barrier structures," J. Appl. Phys., vol. 92, pp. 261-267, 2002.
    • (2002) J. Appl. Phys. , vol.92 , pp. 261-267
    • Casperson, J.D.1    Bell, L.D.2    Atwater, H.A.3
  • 11
    • 3242886116 scopus 로고    scopus 로고
    • Quasisuperlattice storage: A concept of multilevel charge storage
    • T. C. Chang, S. T. Yan, P. T. Liu, C. W. Chen, H. H. Wu, and S. M. Sze, "Quasisuperlattice storage: A concept of multilevel charge storage," Appl. Phys. Lett., vol. 85, pp. 248-250, 2004.
    • (2004) Appl. Phys. Lett. , vol.85 , pp. 248-250
    • Chang, T.C.1    Yan, S.T.2    Liu, P.T.3    Chen, C.W.4    Wu, H.H.5    Sze, S.M.6
  • 13
    • 13644281541 scopus 로고    scopus 로고
    • Threshold voltage shift of heteronanocrystal floating gate flash memory
    • Y. Zhu, D. T. Zhao, R. G. Li, and J. L. Liu, "Threshold voltage shift of heteronanocrystal floating gate flash memory," J. Appl Phys., vol. 97, p. 034 309, 2005.
    • (2005) J. Appl Phys. , vol.97 , pp. 034309
    • Zhu, Y.1    Zhao, D.T.2    Li, R.G.3    Liu, J.L.4
  • 14
    • 0001048516 scopus 로고
    • Valence band offset at stained Si/Ge interface
    • L. Colombo, R. Resta, and R. Baroni, "Valence band offset at stained Si/Ge interface," Phys. Rev. B, Condens. Matter, vol. 11, pp. 5572-5579, 1991.
    • (1991) Phys. Rev. B, Condens. Matter , vol.11 , pp. 5572-5579
    • Colombo, L.1    Resta, R.2    Baroni, R.3
  • 16
    • 0035894207 scopus 로고    scopus 로고
    • Emission lifetime of polarizable charge stored in nano-crystalline Si based single-electron memory
    • B. J. Hinds, T. Yamanaka, and S. Oda, "Emission lifetime of polarizable charge stored in nano-crystalline Si based single-electron memory," J. Appl. Phys., vol. 90, pp. 6402-6408, 2001.
    • (2001) J. Appl. Phys. , vol.90 , pp. 6402-6408
    • Hinds, B.J.1    Yamanaka, T.2    Oda, S.3
  • 17
    • 0020163706 scopus 로고
    • On tunneling in metal-oxide-silicon structures
    • Z. A. Weinberg, "On tunneling in metal-oxide-silicon structures," J. Appl. Phys., vol. 53, pp. 5052-5056, 1982.
    • (1982) J. Appl. Phys. , vol.53 , pp. 5052-5056
    • Weinberg, Z.A.1
  • 18
    • 0033579745 scopus 로고    scopus 로고
    • Analytic model for direct tunneling current in polycrystalline silicon-gate metal-oxide-semiconductor devices
    • L. F. Register, E. Rosenbaum, and K. Yang, "Analytic model for direct tunneling current in polycrystalline silicon-gate metal-oxide-semiconductor devices," Appl. Phys. Lett., vol. 74, pp. 457-459, 1998.
    • (1998) Appl. Phys. Lett. , vol.74 , pp. 457-459
    • Register, L.F.1    Rosenbaum, E.2    Yang, K.3
  • 19
    • 24244446233 scopus 로고
    • Calculation of transmission tunneling current across arbitrary potential barriers
    • Y. Ando and T. Itoh, "Calculation of transmission tunneling current across arbitrary potential barriers," J. Appl. Phys., vol. 61, pp. 1497-1502, 1986.
    • (1986) J. Appl. Phys. , vol.61 , pp. 1497-1502
    • Ando, Y.1    Itoh, T.2
  • 20
    • 0141886906 scopus 로고    scopus 로고
    • Stress current calculation of stacked dielectrics in time dependent dielectric breakdown
    • W. W. Yang, X. H. Cheng, Y. M. Xing, W. J. Li, and Y. H. Yu, "Stress current calculation of stacked dielectrics in time dependent dielectric breakdown," J. Appl. Phys., vol. 94, pp. 4032-4035, 2003.
    • (2003) J. Appl. Phys. , vol.94 , pp. 4032-4035
    • Yang, W.W.1    Cheng, X.H.2    Xing, Y.M.3    Li, W.J.4    Yu, Y.H.5
  • 21
    • 0041409576 scopus 로고    scopus 로고
    • Impact of crystal size and tunnel dielectric on semiconductor nanocrystal memory performance
    • Sep.
    • M. She and T. J. King, "Impact of crystal size and tunnel dielectric on semiconductor nanocrystal memory performance," IEEE Trans. Electron Devices, vol. 50, no. 9, pp. 1934-1940, Sep. 2003.
    • (2003) IEEE Trans. Electron Devices , vol.50 , Issue.9 , pp. 1934-1940
    • She, M.1    King, T.J.2
  • 22
    • 3042822401 scopus 로고    scopus 로고
    • Minimization of germanium penetration, nanocrystal formation, charge storage, and retention in a trilayer memory structure with silicon nitride/hafnium dioxide stack as the tunnel dielectric
    • T. H. Ng, W. K. Chim, W. K. Choi, V. Ho, L. W. Teo, A. Y. Du, and C. H. Tung, "Minimization of germanium penetration, nanocrystal formation, charge storage, and retention in a trilayer memory structure with silicon nitride/hafnium dioxide stack as the tunnel dielectric," Appl. Phys. Lett., vol. 84, pp. 4385-4387, 2004.
    • (2004) Appl. Phys. Lett. , vol.84 , pp. 4385-4387
    • Ng, T.H.1    Chim, W.K.2    Choi, W.K.3    Ho, V.4    Teo, L.W.5    Du, A.Y.6    Tung, C.H.7
  • 23
    • 17144475022 scopus 로고    scopus 로고
    • An improved shooting approach for solving the time-independent Schrödinger equation for III/V QW structures
    • S. F. P. Paul and H. Fouckhardt, "An improved shooting approach for solving the time-independent Schrödinger equation for III/V QW structures," Phys. Lett., vol. 286, pp. 199-204, 2001.
    • (2001) Phys. Lett. , vol.286 , pp. 199-204
    • Paul, S.F.P.1    Fouckhardt, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.