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Volumn 21, Issue 9, 2005, Pages 4117-4122

Nanoscale patterning of alkyl monolayers on silicon using the atomic force microscope

Author keywords

[No Author keywords available]

Indexed keywords

ALKYL MONOLAYERS; NANOSCALE PATTERNING; STANDARD DEVIATION; TOPOGRAPHICAL IMAGES;

EID: 18544374284     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0481905     Document Type: Article
Times cited : (64)

References (83)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.