Electrical conduction of conjugated molecular SAMs studied by conductive atomic force microscopy

Journal of Physical Chemistry B

Volumn 106, Issue 23, 2002, Pages 5886-5892

  Ishida, Takao ^a,b   Mizutani, Wataru ^a,c   Aya, Yoichiro ^d   Ogiso, Hisato ^a,c   Sasaki, Shinya ^a   Tokumoto, Hiroshi ^a,c  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^d JRCAT Angstrom Technology Partnership (ATP)   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DECAY CONSTANTS;

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; OLIGOMERS; TRANSCONDUCTANCE;

SELF ASSEMBLY;

EID: 0037071988     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0134749     Document Type: Article

References (47)

1. Carter, F.L. Molecular Electric Devices, Marcel Dekker: New York, 1982.
2. Joachim, C.; Gimzewski, J.K.; Aviram, A. Nature 2000, 408, 541.
3. Tour, J.M.; Jones, L., II; Pearson, D.L.; Lamba, J.J.; Burgin, T.P.; Whitesides, G.M.; Allara, D.L.; Parkh, A.N.; Atre, S.V. J. Am. Chem. Soc. 1995, 117, 9529.
4. Tanaka, S.; Yamashita, Y. Synth. Met. 1999, 101, 532.
5. Sabatani, E.; Cohne-Boulakia, J.; Bruening, M.; Rubinstein, I. Langmuir 1993, 9, 2974.
6. Tao, Y.-T.; Wu, C.-C.; Eu, J.-Y.; Lin, W.-L.; Wu, K.-C.; Chen, C. Langmuir 1997, 13, 4018.
7. Geyer, W.; Stadler, V.; Eck, W.; Zharnikov, M.; Golzhauser, A.; Grunze, M. Appl. Phys. Lett. 1999, 75, 2401.
8. Kang, J.F.; Ulman, A.; Liao, S.; Jordan, R.; Yang, G.; Liu, L.-Y. Langmuir 2001, 17, 95.
9. Zharnikov, M.; Frey, S.; Rong, H.; Yang, Y.-J.; Heister, K.; Buck, M.; Grunze, M. Phys. Chem. Chem. Phys. 2000, 2, 3359.
10. Frey, S.; Stadler, K.; Heister, K.; Eck, W.; Zharnikov, M.; Grunze, M.; Zeysing, B.; Terfort, A. Langmuir 2001, 17, 2408.
11. Heister, K.; Zharnikov, M.; Gmnze, M.; Johanson, L.S.O. J. Phys. Chem. B 2001, 105, 4058.
12. Zehner, R.W.; Parsons, B.F.; Hsung, R.P.; Sita, L.R. Langmuir 1999, 15, 1121.
13. Leung, T.Y.B.; Schwartz, P.; Scoles, G.; Schreiber, F.; Ulman, A. Surf. Sci. 2000, 458, 34.
14. Dhirani, Al.-A.; Zehner, R.W.; Hsung, R.P.; Guyot-Sionnest, P.; Sita, L.R. J. Am. Chem. Soc. 1996, 118, 3319.
15. Yang, G.; Qian, Y.; Engtrakul, C.; Sita, L.R.; Liu, G.-Y. J. Phys. Chem. B 2000, 104, 9059.
16. Nakamura, T.; Kondoh, H.; Matsumoto, M.; Nozoye, H. Langmuir 1996, 12, 5977.
17. Dishner, M.H.; Hemminger, J.C.; Feher, F.J. Langmuir 1996, 12, 6176.
18. Bumm, L.A.; Arnold, J.J.; Cygan, M.T.; Dunbar, T.D.; Jones, L., II; Allara, D.L.; Tour, J.M.; Weiss, P.S. Science 1996, 271, 1705. Cygan, M.T.; Dunbar, T.D.; Arnold, J.J.; Bumm, L.A.; Shedlock, N.F.; Burgin, T.P.; Jones, L., II; Allara, D.L.; Tour, J.M.; Weiss, P.S. J. Am. Chem. Soc. 1998, 120, 2721.
19. Bumm, L.A.; Arnold, J.J.; Cygan, M.T.; Dunbar, T.D.; Jones, L., II; Allara, D.L.; Tour, J.M.; Weiss, P.S. Science 1996, 271, 1705. Cygan, M.T.; Dunbar, T.D.; Arnold, J.J.; Bumm, L.A.; Shedlock, N.F.; Burgin, T.P.; Jones, L., II; Allara, D.L.; Tour, J.M.; Weiss, P.S. J. Am. Chem. Soc. 1998, 120, 2721.
20. Bumm, L.A.; Arnold, J.J.; Dunbar, T.D.; Allara, D.L.; Weiss, P.S. J. Phys. Chem. B 1999, 103, 8122.
21. Datta, S.; Tian, W.; Hong, S.; Reifenberger, R.; Henderson, J.I.; Kubiak, C.P. Phys. Rev. Lett. 1997, 79, 2530.
22. Ishida, T.; Mizutani, W.; Akiba, U.; Umemura, K.; Inoue, A.; Choi, N.; Fujihira, M.; Tokumoto, H. J. Phys. Chem. B 1999, 103, 1686.
23. Mizutani, W.; Ishida, T.; Tokumoto, H. Jpn. J. Appl. Phys. 1999, 38, 3892.
24. Ishida, T.; Mizutani, W.; Tokumoto, H.; Choi, N.; Akiba, U.; Fujihira, M. J. Vac. Sci. Technol. 2000, A18, 1437.
25. Ishida, T.; Mizutani, W.; Choi, N.; Akiba, U.; Fujihira, M.; Tokumoto, H. J. Phys. Chem. B 2000, 104, 11680.
26. Leatherman, G.; Durantini, E.N.; Gust, D.; Moore, T.A.; Moore, A.L.; Stone, S.; Zhou, Z.; Lez, P.; Liu, Y.Z.; Lindsay, S.M. J. Phys. Chem. B 1999, 103, 4006.
27. Kelly, K.F.; Shom, T.-S.; Lee, T.R.; Halas, N.J. J. Phys. Chem. B 1999, 103, 8639.
28. Kergueris, C.; Bourgoin, J.P.; Palacin, S. Nanotechnology 1999, 10, 8.
29. Salmeron, M.; Neubauer, G.; Folch, A.; Tomitori, M.; Ogletree, D.F.; Sautet, P. Langmuir 1993, 8, 3600.
30. Wold, D.J.; Frisbie, C.D. J. Am. Chem. Soc. 2000, 122, 2970.
31. Wold, D.J.; Frisbie, C.D. J. Am. Chem. Soc. 2001, 123, 5549.
32. Reed, M.A.; Zhou, C.; Muller, C.J.; Burgin, T.P.; Tour, J.M. Science 1997, 278, 252.
33. Zhou, C.; Deshpande, M.R.; Reed, M.A.; Jones, L., II; Tour, J.M. Appl. Phys. Lett. 1997, 71, 611.
34. Chen, J.; Reed, M.A.; Rawlett, A.M.; Tour, J.M. Science 1999, 286, 1550.
35. Bain, C.D.; Troughton, E.B.; Tao, Y.-T.; Evall, J.; Whitesides, G.M.; Nuzzo, R.G. J. Am. Chem. Soc. 1989, 111, 321.
36. Recently, we found that that the adsorption process and final arrangement of the TP molecules without a methylene group dependent on the solvent in which the molecules can dissolve. When methylene chloride was used as a solvent, the TP molecules nucleate anisotropically along (112) directions with a 3-fold symmetry at the initial stage. On the other hand, when ethanol was used as a solvent, the adsorption process of the TP molecules without a methylene group completely changed, and molecular lattices were observed. Ishida, T.; Mizutani, W.; Azehara, H.; Sato, F.; Choi, N.; Akiba, U.; Fujihira, M.; Tokumoto, H. Langmuir 2001, 17, 7459. However, even when methylene chloride solvent was used, a molecular lattice was observed (Duan, L.; Grarrent, S.J. J. Phys. Chem. B 2001, 105, 9812.). We do not know the reason for the discrepancy. In any case, it is difficult to obtain highly ordered SAMs from TP or biphenyl molecules without a methylene group and this is still a controversial issue.
37. Recently, we found that that the adsorption process and final arrangement of the TP molecules without a methylene group dependent on the solvent in which the molecules can dissolve. When methylene chloride was used as a solvent, the TP molecules nucleate anisotropically along (112) directions with a 3-fold symmetry at the initial stage. On the other hand, when ethanol was used as a solvent, the adsorption process of the TP molecules without a methylene group completely changed, and molecular lattices were observed. Ishida, T.; Mizutani, W.; Azehara, H.; Sato, F.; Choi, N.; Akiba, U.; Fujihira, M.; Tokumoto, H. Langmuir 2001, 17, 7459. However, even when methylene chloride solvent was used, a molecular lattice was observed (Duan, L.; Grarrent, S.J. J. Phys. Chem. B 2001, 105, 9812.). We do not know the reason for the discrepancy. In any case, it is difficult to obtain highly ordered SAMs from TP or biphenyl molecules without a methylene group and this is still a controversial issue.
38. Ratner, M.A.; Davis, B.; Kemp, M.; Mujica, V.; Roitberg, A.; Yaliraki, S. Ann. N.Y. Acad. Sci. 1998, 852.
39. Samanta, M.P.; Tian, W.; Datta, S.; Henderson, J.I.; Kubiak, C.P. Phys. Rev. B 1996, 53, R7626.
40. Lindsay, S.M.; Sankey, O.F.; Li, Y.; Herbst, C.; Rupprecht, A.J. Phys. Chem. 1990, 94, 4655.
41. Magoga, M.; Joachim, C. Phys. Rev. B 1999, 59, 16011.
42. Inoue, A.; Mizutani, W.; Ishida, T.; Tokumoto, H. Appl. Phys. A 1998, 66, S1241.
43. See, for example, Hunter, C.A.; Sanders, J.K.M. J. Am. Chem. Soc. 1990, 112, 6561.
44. 2 at 37.5 nN. In ref 30, Wold and Frisble took into account the tip-SAM pull-off force to obtain the contact area. However, we did not take into account this force.
45. A contact problem between the molecule and the metal tip is also an important problem and considered to increase the resistance. To reduce such an effect, a new technique by inserting a Au particle between the tip and molecule was proposed. Cui, X.D.; Primak, A.; Zarate, X.; Tomfohr, J.; Sankey, O.F.; Moore, A.L.; Moore, T.A.; Gust, D.; Harris, G.; Lindsay, S.M. Science 2001, 294, 571.
46. 9 Ω order.
47. 11 Ω.