Design and test of large embedded memories: An overview

IEEE Design and Test of Computers

Volumn 18, Issue 3, 2001, Pages 16-27

  Rajsuman, Rochit ^a  

^a Advantest America R and D Center   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BUILT-IN SELF TEST; COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SIMULATION; EMBEDDED SYSTEMS; FLASH MEMORY; LOGIC DESIGN; MICROPROCESSOR CHIPS; PROGRAM COMPILERS; RELIABILITY; STORAGE ALLOCATION (COMPUTER);

BUILT-IN SELF REPAIR; ELECTRONIC DESIGN AUTOMATION; EMBEDDED MEMORY; SILICON ON CHIP;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 0035339148     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.922800     Document Type: Article

References (20)

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