Defect-tolerant, fine-grained parallel testing of a Cell Matrix

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4867, Issue , 2002, Pages 71-85

  Durbeck, Lisa J K ^a   Macias, Nicholas J ^a  

^a Cell Matrix Corporation   (United States)

Author keywords

Autonomous; Cell Matrix; Fault testing; Fault tolerance; Nanotechnology; Process driver; Reconfigurable hardware; Self contigurable

Indexed keywords

COMPUTER HARDWARE; FAULT TOLERANT COMPUTER SYSTEMS; MATRIX ALGEBRA; NANOTECHNOLOGY;

RECONFIGURABLE HARDWARE;

PARALLEL PROCESSING SYSTEMS;

EID: 0036427308     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.455473     Document Type: Article

References (11)

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8. L.J.K. Durbeck and N.J. Macias, "A Process Driver for Nanofabrication: Detecting and Analysing Hardware Defects using the Cell Matrix Computing Architecture," submitted abstract for The Ninth Foresight Conference on Molecular Nanotechnology, available from http://www.foresight.org/Conferences/MNT9/Abstracts/Macias/index.html, November 2001.
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