메뉴 건너뛰기




Volumn 15, Issue 4, 2005, Pages 728-735

Young's modulus, Poisson's ratio and failure properties of tetrahedral amorphous diamond-like carbon for MEMS devices

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; DIAMOND LIKE CARBON FILMS; ELASTIC MODULI; ELASTICITY; FAILURE (MECHANICAL); HYDROGEN; NANOSTRUCTURED MATERIALS; OPTICAL CORRELATION; POISSON RATIO; TENSILE STRENGTH;

EID: 17444373545     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/15/4/009     Document Type: Article
Times cited : (102)

References (28)
  • 3
    • 0037165927 scopus 로고    scopus 로고
    • Diamond-like amorphous carbon
    • Robertson J 2002 Diamond-like amorphous carbon Mater. Sci. Eng. R 37 129-281
    • (2002) Mater. Sci. Eng. R , vol.37 , pp. 129-281
    • Robertson, J.1
  • 5
    • 0343026387 scopus 로고    scopus 로고
    • Diamond microstructures for optical micro electromechanical systems
    • Bjorkman H, Rangsten P and Hjort K 1999 Diamond microstructures for optical micro electromechanical systems Sensors Actuators 78 41-7
    • (1999) Sensors Actuators , vol.78 , pp. 41-47
    • Bjorkman, H.1    Rangsten, P.2    Hjort, K.3
  • 8
    • 0037210072 scopus 로고    scopus 로고
    • A methodology for determining mechanical properties of freestanding thin films and MEMS materials
    • Espinosa H D, Prorok B C and Fischer M 2003 A methodology for determining mechanical properties of freestanding thin films and MEMS materials J. Mech. Phys. Solids 51 47-67
    • (2003) J. Mech. Phys. Solids , vol.51 , pp. 47-67
    • Espinosa, H.D.1    Prorok, B.C.2    Fischer, M.3
  • 10
    • 0004412668 scopus 로고
    • Mechanical and tribological properties of diamond-like carbon coatings prepared by pulsed laser deposition
    • Voevodin A A, Donley M S, Zabinski J S and Bultman J E 1995 Mechanical and tribological properties of diamond-like carbon coatings prepared by pulsed laser deposition Surf. Coat. Technol. 77 534-9
    • (1995) Surf. Coat. Technol. , vol.77 , pp. 534-539
    • Voevodin, A.A.1    Donley, M.S.2    Zabinski, J.S.3    Bultman, J.E.4
  • 12
    • 0035939507 scopus 로고    scopus 로고
    • Measurements of elastic properties of ultra-thin diamond-like carbon coatings using atomic force acoustic microscopy
    • Amelio S, Goldade A V, Rabe U, Sherer V, Bhushan B and Arnold W 2001 Measurements of elastic properties of ultra-thin diamond-like carbon coatings using atomic force acoustic microscopy Thin Solid Films 392 75-84
    • (2001) Thin Solid Films , vol.392 , pp. 75-84
    • Amelio, S.1    Goldade, A.V.2    Rabe, U.3    Sherer, V.4    Bhushan, B.5    Arnold, W.6
  • 15
    • 10944243002 scopus 로고    scopus 로고
    • Experimental mechanics for MEMS and thin films: Direct and local sub-micron strain measurements
    • ed V M Harik and L-S Luo (Dordrech: Kluwer)
    • Chasiotis I 2004 Experimental mechanics for MEMS and thin films: direct and local sub-micron strain measurements Micromechanics and Nanoscale Effects: MEMS, Multi-Scale Materials and Micro-Flows ed V M Harik and L-S Luo (Dordrech: Kluwer) pp 3-37
    • (2004) Micromechanics and Nanoscale Effects: MEMS, Multi-scale Materials and Micro-flows , pp. 3-37
    • Chasiotis, I.1
  • 16
    • 0036504397 scopus 로고    scopus 로고
    • A new microtensile tester for the study of MEMS materials with the aid of atomic force microscopy
    • Chasiotis I and Knauss W G 2002 A new microtensile tester for the study of MEMS materials with the aid of atomic force microscopy Exp. Mech. 42 51-7
    • (2002) Exp. Mech. , vol.42 , pp. 51-57
    • Chasiotis, I.1    Knauss, W.G.2
  • 17
    • 0037340866 scopus 로고    scopus 로고
    • Mechanical measurements at the micron and nanometer scales
    • Knauss W G, Chasiotis I and Huang Y 2003 Mechanical measurements at the micron and nanometer scales Mech. Mater. 35 217-31
    • (2003) Mech. Mater. , vol.35 , pp. 217-231
    • Knauss, W.G.1    Chasiotis, I.2    Huang, Y.3
  • 18
    • 33747539431 scopus 로고    scopus 로고
    • Tensile testing of polycrystalline silicon thin films using electrostatic force grip
    • Tsuchiya T, Tabata O, Sakata J and Taga Y 1996 Tensile testing of polycrystalline silicon thin films using electrostatic force grip Trans. Inst. Electr. Eng. Japan E 116-E 441-6
    • (1996) Trans. Inst. Electr. Eng. Japan E , vol.116 E , pp. 441-446
    • Tsuchiya, T.1    Tabata, O.2    Sakata, J.3    Taga, Y.4
  • 19
    • 0031236953 scopus 로고    scopus 로고
    • A new technique for measuring the mechanical properties of thin films
    • Sharpe W N, Yuan B and Edwards R L 1997 A new technique for measuring the mechanical properties of thin films J. Microelectromech. Syst. 6 193-9
    • (1997) J. Microelectromech. Syst. , vol.6 , pp. 193-199
    • Sharpe, W.N.1    Yuan, B.2    Edwards, R.L.3
  • 20
    • 0032296649 scopus 로고    scopus 로고
    • Investigation of thin film mechanical properties by probe microscopy
    • Chasiotis I and Knauss W G 1998 Investigation of thin film mechanical properties by probe microscopy Proc. SPIE - Int. Soc. Opt. Eng. 3512 66-75
    • (1998) Proc. SPIE - Int. Soc. Opt. Eng. , vol.3512 , pp. 66-75
    • Chasiotis, I.1    Knauss, W.G.2
  • 21
    • 0034542354 scopus 로고    scopus 로고
    • Microtensile tests with the aid of probe microscopy for the study of MEMS materials
    • Chasiotis I and Knauss W G 2000 Microtensile tests with the aid of probe microscopy for the study of MEMS materials Proc. SPIE - Int. Soc. Opt. Eng. 4175 96-103
    • (2000) Proc. SPIE - Int. Soc. Opt. Eng. , vol.4175 , pp. 96-103
    • Chasiotis, I.1    Knauss, W.G.2
  • 22
    • 2442536380 scopus 로고    scopus 로고
    • Mechanical properties of tetrahedral amorphous diamond-like carbon (ta-C) MEMS
    • Chasiotis I, Cho S, Friedman T A and Sullivan J 2003 Mechanical properties of tetrahedral amorphous diamond-like carbon (ta-C) MEMS Proc. Soc. Exp. Mech. 170-5
    • (2003) Proc. Soc. Exp. Mech. , pp. 170-175
    • Chasiotis, I.1    Cho, S.2    Friedman, T.A.3    Sullivan, J.4
  • 24
    • 0032095839 scopus 로고    scopus 로고
    • Submicron deformation field measurements: Part 2. Improved digital image T correlation
    • Vendroux G and Knauss W G 1998 Submicron deformation field measurements: part 2. Improved digital image T correlation Exp. Mech. 38 86-91
    • (1998) Exp. Mech. , vol.38 , pp. 86-91
    • Vendroux, G.1    Knauss, W.G.2
  • 27
    • 0038382884 scopus 로고    scopus 로고
    • The mechanical strength of polysilicon films: 2. Size effects associated with elliptical and circular perforations
    • Chasiotis I and Knauss W G 2003 The mechanical strength of polysilicon films: 2. Size effects associated with elliptical and circular perforations J. Mech. Phys. Solids 51 1551-72
    • (2003) J. Mech. Phys. Solids , vol.51 , pp. 1551-1572
    • Chasiotis, I.1    Knauss, W.G.2
  • 28
    • 4444258411 scopus 로고    scopus 로고
    • Using multidimensional contact mechanics experiments to measure Poisson's ratio
    • Lucas B N, Hay J C and Oliver W C 2004 Using multidimensional contact mechanics experiments to measure Poisson's ratio J. Mater. Res. 19 58-65
    • (2004) J. Mater. Res. , vol.19 , pp. 58-65
    • Lucas, B.N.1    Hay, J.C.2    Oliver, W.C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.