-
1
-
-
17144440620
-
Developing a new material for MEMS: Amorphous diamond
-
Sullivan J P, Friedmann T A, De Boer M P, La Van D A, Hohlfelder R J, Ashby C I H, Dugger M T, Mitchell M, Dunn R G and Magerkurth A J 2000 Developing a new material for MEMS: amorphous diamond Mater. Res. Soc. Symp. Proc. 657 EE7.1
-
(2000)
Mater. Res. Soc. Symp. Proc.
, vol.657
-
-
Sullivan, J.P.1
Friedmann, T.A.2
De Boer, M.P.3
Van La, D.A.4
Hohlfelder, R.J.5
Ashby, C.I.H.6
Dugger, M.T.7
Mitchell, M.8
Dunn, R.G.9
Magerkurth, A.J.10
-
2
-
-
0000075431
-
Thick stress-free amorphous-tetrahedral carbon films with hardness near that of diamond
-
Friedmann T A, Sullivan J P, Knapp J A, Tallant D R, Follstaedt D M, Medlin D L and Mirkarimi P B 1997 Thick stress-free amorphous-tetrahedral carbon films with hardness near that of diamond Appl. Phys. Lett. 71 3820-2
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 3820-3822
-
-
Friedmann, T.A.1
Sullivan, J.P.2
Knapp, J.A.3
Tallant, D.R.4
Follstaedt, D.M.5
Medlin, D.L.6
Mirkarimi, P.B.7
-
3
-
-
0037165927
-
Diamond-like amorphous carbon
-
Robertson J 2002 Diamond-like amorphous carbon Mater. Sci. Eng. R 37 129-281
-
(2002)
Mater. Sci. Eng. R
, vol.37
, pp. 129-281
-
-
Robertson, J.1
-
5
-
-
0343026387
-
Diamond microstructures for optical micro electromechanical systems
-
Bjorkman H, Rangsten P and Hjort K 1999 Diamond microstructures for optical micro electromechanical systems Sensors Actuators 78 41-7
-
(1999)
Sensors Actuators
, vol.78
, pp. 41-47
-
-
Bjorkman, H.1
Rangsten, P.2
Hjort, K.3
-
7
-
-
0000060843
-
Fabrication of single-crystal diamond microcomponents
-
Hunn J D, Withrow S P, White C W, Clausing R E and Heatherly L 1994 Fabrication of single-crystal diamond microcomponents Appl. Phys. Lett. 65 3072-4
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 3072-3074
-
-
Hunn, J.D.1
Withrow, S.P.2
White, C.W.3
Clausing, R.E.4
Heatherly, L.5
-
8
-
-
0037210072
-
A methodology for determining mechanical properties of freestanding thin films and MEMS materials
-
Espinosa H D, Prorok B C and Fischer M 2003 A methodology for determining mechanical properties of freestanding thin films and MEMS materials J. Mech. Phys. Solids 51 47-67
-
(2003)
J. Mech. Phys. Solids
, vol.51
, pp. 47-67
-
-
Espinosa, H.D.1
Prorok, B.C.2
Fischer, M.3
-
9
-
-
0032117257
-
Non-destructive characterization of mechanical and structural properties of amorphous diamond-like carbon films
-
Schneider D, Meyer C F, Mai H, Schoneich B, Ziegele H, Scheibe H J and Lifshitz Y 1998 Non-destructive characterization of mechanical and structural properties of amorphous diamond-like carbon films Diamond Relat. Mater. 7 973-80
-
(1998)
Diamond Relat. Mater.
, vol.7
, pp. 973-980
-
-
Schneider, D.1
Meyer, C.F.2
Mai, H.3
Schoneich, B.4
Ziegele, H.5
Scheibe, H.J.6
Lifshitz, Y.7
-
10
-
-
0004412668
-
Mechanical and tribological properties of diamond-like carbon coatings prepared by pulsed laser deposition
-
Voevodin A A, Donley M S, Zabinski J S and Bultman J E 1995 Mechanical and tribological properties of diamond-like carbon coatings prepared by pulsed laser deposition Surf. Coat. Technol. 77 534-9
-
(1995)
Surf. Coat. Technol.
, vol.77
, pp. 534-539
-
-
Voevodin, A.A.1
Donley, M.S.2
Zabinski, J.S.3
Bultman, J.E.4
-
11
-
-
0032614086
-
Elastic constants of tetrahedral amorphous carbon films by surface Brillouin scattering
-
Ferrari A C, Robertson J, Beghi M G, Bottani C E, Ferulano R and Pastorelli R 1999 Elastic constants of tetrahedral amorphous carbon films by surface Brillouin scattering Appl. Phys. Lett. 75 1893-5
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 1893-1895
-
-
Ferrari, A.C.1
Robertson, J.2
Beghi, M.G.3
Bottani, C.E.4
Ferulano, R.5
Pastorelli, R.6
-
12
-
-
0035939507
-
Measurements of elastic properties of ultra-thin diamond-like carbon coatings using atomic force acoustic microscopy
-
Amelio S, Goldade A V, Rabe U, Sherer V, Bhushan B and Arnold W 2001 Measurements of elastic properties of ultra-thin diamond-like carbon coatings using atomic force acoustic microscopy Thin Solid Films 392 75-84
-
(2001)
Thin Solid Films
, vol.392
, pp. 75-84
-
-
Amelio, S.1
Goldade, A.V.2
Rabe, U.3
Sherer, V.4
Bhushan, B.5
Arnold, W.6
-
13
-
-
0242664700
-
Fracture strength of ultrananocrystalline diamond thin films-identification of Weibull parameters
-
Espinosa H D, Peng B, Prorok B C, Moldovan N, Auciello O, Carlisle J A, Gruen D M and Mancini D C 2003 Fracture strength of ultrananocrystalline diamond thin films-identification of Weibull parameters J. Appl. Phys. 94 6076-84
-
(2003)
J. Appl. Phys.
, vol.94
, pp. 6076-6084
-
-
Espinosa, H.D.1
Peng, B.2
Prorok, B.C.3
Moldovan, N.4
Auciello, O.5
Carlisle, J.A.6
Gruen, D.M.7
Mancini, D.C.8
-
15
-
-
10944243002
-
Experimental mechanics for MEMS and thin films: Direct and local sub-micron strain measurements
-
ed V M Harik and L-S Luo (Dordrech: Kluwer)
-
Chasiotis I 2004 Experimental mechanics for MEMS and thin films: direct and local sub-micron strain measurements Micromechanics and Nanoscale Effects: MEMS, Multi-Scale Materials and Micro-Flows ed V M Harik and L-S Luo (Dordrech: Kluwer) pp 3-37
-
(2004)
Micromechanics and Nanoscale Effects: MEMS, Multi-scale Materials and Micro-flows
, pp. 3-37
-
-
Chasiotis, I.1
-
16
-
-
0036504397
-
A new microtensile tester for the study of MEMS materials with the aid of atomic force microscopy
-
Chasiotis I and Knauss W G 2002 A new microtensile tester for the study of MEMS materials with the aid of atomic force microscopy Exp. Mech. 42 51-7
-
(2002)
Exp. Mech.
, vol.42
, pp. 51-57
-
-
Chasiotis, I.1
Knauss, W.G.2
-
17
-
-
0037340866
-
Mechanical measurements at the micron and nanometer scales
-
Knauss W G, Chasiotis I and Huang Y 2003 Mechanical measurements at the micron and nanometer scales Mech. Mater. 35 217-31
-
(2003)
Mech. Mater.
, vol.35
, pp. 217-231
-
-
Knauss, W.G.1
Chasiotis, I.2
Huang, Y.3
-
18
-
-
33747539431
-
Tensile testing of polycrystalline silicon thin films using electrostatic force grip
-
Tsuchiya T, Tabata O, Sakata J and Taga Y 1996 Tensile testing of polycrystalline silicon thin films using electrostatic force grip Trans. Inst. Electr. Eng. Japan E 116-E 441-6
-
(1996)
Trans. Inst. Electr. Eng. Japan E
, vol.116 E
, pp. 441-446
-
-
Tsuchiya, T.1
Tabata, O.2
Sakata, J.3
Taga, Y.4
-
19
-
-
0031236953
-
A new technique for measuring the mechanical properties of thin films
-
Sharpe W N, Yuan B and Edwards R L 1997 A new technique for measuring the mechanical properties of thin films J. Microelectromech. Syst. 6 193-9
-
(1997)
J. Microelectromech. Syst.
, vol.6
, pp. 193-199
-
-
Sharpe, W.N.1
Yuan, B.2
Edwards, R.L.3
-
20
-
-
0032296649
-
Investigation of thin film mechanical properties by probe microscopy
-
Chasiotis I and Knauss W G 1998 Investigation of thin film mechanical properties by probe microscopy Proc. SPIE - Int. Soc. Opt. Eng. 3512 66-75
-
(1998)
Proc. SPIE - Int. Soc. Opt. Eng.
, vol.3512
, pp. 66-75
-
-
Chasiotis, I.1
Knauss, W.G.2
-
21
-
-
0034542354
-
Microtensile tests with the aid of probe microscopy for the study of MEMS materials
-
Chasiotis I and Knauss W G 2000 Microtensile tests with the aid of probe microscopy for the study of MEMS materials Proc. SPIE - Int. Soc. Opt. Eng. 4175 96-103
-
(2000)
Proc. SPIE - Int. Soc. Opt. Eng.
, vol.4175
, pp. 96-103
-
-
Chasiotis, I.1
Knauss, W.G.2
-
23
-
-
0020797243
-
Determination of displacements using an improved digital image correlation method
-
Sutton M A, Wolters W J, Peters W H, Ranson W F and McNeil S R 1983 Determination of displacements using an improved digital image correlation method Image Vis. Comput. 1 133-9
-
(1983)
Image Vis. Comput.
, vol.1
, pp. 133-139
-
-
Sutton, M.A.1
Wolters, W.J.2
Peters, W.H.3
Ranson, W.F.4
McNeil, S.R.5
-
24
-
-
0032095839
-
Submicron deformation field measurements: Part 2. Improved digital image T correlation
-
Vendroux G and Knauss W G 1998 Submicron deformation field measurements: part 2. Improved digital image T correlation Exp. Mech. 38 86-91
-
(1998)
Exp. Mech.
, vol.38
, pp. 86-91
-
-
Vendroux, G.1
Knauss, W.G.2
-
27
-
-
0038382884
-
The mechanical strength of polysilicon films: 2. Size effects associated with elliptical and circular perforations
-
Chasiotis I and Knauss W G 2003 The mechanical strength of polysilicon films: 2. Size effects associated with elliptical and circular perforations J. Mech. Phys. Solids 51 1551-72
-
(2003)
J. Mech. Phys. Solids
, vol.51
, pp. 1551-1572
-
-
Chasiotis, I.1
Knauss, W.G.2
-
28
-
-
4444258411
-
Using multidimensional contact mechanics experiments to measure Poisson's ratio
-
Lucas B N, Hay J C and Oliver W C 2004 Using multidimensional contact mechanics experiments to measure Poisson's ratio J. Mater. Res. 19 58-65
-
(2004)
J. Mater. Res.
, vol.19
, pp. 58-65
-
-
Lucas, B.N.1
Hay, J.C.2
Oliver, W.C.3
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